11

An analytical expression for predicting wearout lifetime of thin gate and tunneling oxide

Year:
2002
Language:
english
File:
PDF, 237 KB
english, 2002
30

Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides

Year:
2003
Language:
english
File:
PDF, 239 KB
english, 2003
43

The frequency spectrum of reciprocal capacitance and its derivative in MOS systems

Year:
1986
Language:
english
File:
PDF, 534 KB
english, 1986